Showing results: 46 - 58 of 58 items found.
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M9340A -
Keysight Technologies
The M9340A PXIe vector network analyzer RF distributor is used in the M9485A PXIe multiport vector network analyzer. The module distributes the source and local signals from the source modules to the receivers.
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M9370A -
Keysight Technologies
The Keysight M9370A PXIe vector network analyzer is a full two-port VNA that fits in just one slot. It can function as a two-port VNA, or with multiple modules can be configured for multiport or multi-site measurements.
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85059V -
Keysight Technologies
The Keysight 85059V is a 1.0 mm verification kit designed for vector network analyzer systems operating over the frequency range of DC to 120 GHz. This includes a set of standards with known characteristics, traceable to primary standards in the Keysight Technologies calibration lab. This verification kit is used to verify the measurement calibration and also to verify that the PNA/PNA-X based millimeter-wave system is operating within its specifications. The 85059V with 85059B 1 mm calibration kit are replacements for the 85059A 1 mm calibration/verification kit.
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A0040A -
SYCATUS Corp
Optical Noise Analyzer is the industry first solution for evaluation of optical frequency noise of lasers as power spectrum density.
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AQ6360 -
Yokogawa Test & Measurement Corp.
The AQ6360 is the fastest optical spectrum analyzer for optical device manufacturing offered by Yokogawa. It is a cost-effective optical spectrum analyzer ideal for industrial manufacturing of telecom devices such as lasers, optical transceivers and optical amplifiers. The AQ6360 features a wavelength range of 1200 to 1650 nm for ideal manufacturing test performance.
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ADC Corporation
an optical spectrum analyzer for analyzing short wavelengths from 350nm to 1000 nm. Because it adopts a Fourier spectrum system with a Michelson interferometer, the 8341 can measure the coherence. With its narrow wavelength resolution of 0.01nm * , the 8341 is very effective for the evaluation of not only CD/DVD laser diodes, but also for blue-violet laser diodes. In addition, the built-in He-Ne laser acts as a wavelength reference to ensure a high wavelength measurement accuracy of ±0.01nm * . Finally, with its fast 0.5s * measurement speed, the 8341 is ideal for building into systems for mass production and evaluating temperature characteristics of system components.
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APE GmbH
Via the waveScan technology, A·P·E offers a spectrum analyzer for different wavelength ranges of CW and mode-locked laser systems. Featuring high resolution and supreme ease of use, several versions of waveScan are available, to allow measurement of scan rages ranging from 200
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Series HyperLOG ® 70 X -
Aaronia AG
Compatible with any Spectrum Analyzer or Oscilloscope. Incl. High-End Preamplifier. Ultra high gain (44dBi). The HyperLOG X LogPer antenna series can be used to locate extremely weak signals, thanks to the integrated preamplifier. The antenna offers excellent directional characteristics which can be optimized using the optional Laser and Compass.
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Optoplex Corporation
Optoplex’s Multifunction Test and Measurement System (TM100 Series) is designed to provide a flexible and cost effective optical test and measurement solution, particularly for manufacturing lines. The mainframe can be mounted in 19” rack or stationed on desk-top for ease of use. There are many selections of the pluggable modules, from tunable laser, optical spectrum analyzer, EDFA, power meter, ASE light source, optical tunable filter, optical performance monitor, …, etc.
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mks Ophir
The IS1.5-VIS-FPD-800 & IS1.5-IRG-FPD-800 contain 2 photodiodes: a calibrated photodiode for precise power measurement using Ophir meters and a fast photodiode with integral reverse bias circuit for temporal characterization using third-party instrumentation such as oscilloscopes and spectrum analyzers. Their small, 1.5" internal diameter preserves the temporal shape of pulses down to 3.5 nsec for VIS and 6 nsec for IRG. An SMA fiber optic connector is provided for connection to a spectrometer. The large, 20 mm input aperture allows for wide acceptance angles and long working distances, making these spheres well suited for testing VCSELs and other types of laser.
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mks Ophir
Pulse Characterization Sensors provide the ability to see and measure the temporal characteristics of pulsed and CW laser beams. Ophir Fast Photodiode Detectors are designed to convert optical signals into electrical signals which are then measured with third-party instrumentation such as oscilloscopes and spectrum analyzers. Accessories are available to connect to IS6 integrating spheres or fiber optic cables. Attenuating filter accessories are also available to increase their dynamic range. Different models offer silicon, UV enhanced silicon and InGaAs PIN photodiodes, covering a combined spectral range of 193 nm to 1700 nm. Rise times range from 25 picoseconds to 3 nanoseconds. The fast rise times are achieved by an internal reverse bias voltage circuit. Power is supplied by internal batteries and/or an external power supply depending on the model. Detectors should be connected to a 50Ω impedance in order to maintain their nominal rise times. They can be connected to higher impedance loads, but this will result in a significant increase in the rise time. If higher output voltage is required, it is recommended to connect the detector to a trans-impedance amplifier with an Input impedance of 50Ω
